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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

by Brandon Noia, Krishnendu Chakrabarty ...

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, ... Read more

$89.99 USD

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits,
... Read more

VLSI Interview Questions with Answers

by Sam Sony ...

If you can spare half an hour, then we guarantee success at your next VLSI interview. Do you want to secure at least 3 to 4 job offers by succeeding at all the phone and on-site Job interviews for this position? Or you simply want answer to most frequently asked interview questions in digital VLSI design?Did you know that people who made targeted question answer preparation for job interview are 4 ... Read more

$9.99 USD

If you can spare half an hour, then we guarantee success at your next VLSI interview. Do you want to secure at least 3 to 4 job offers by succeeding at all the phone and on-site Job interviews for this position? Or you simply want answer to most frequently asked interview questions in digital VLSI design?Did you know that people who made targeted question answer preparation for job interview are 4
... Read more
Exploring Memory Hierarchy Design with Emerging Memory Technologies

by Guangyu Sun ...

Series series Engineering (R0)
This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the “memory wall.” The ... Read more

$89.99 USD

This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the “memory wall.” The
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Trace-Based Post-Silicon Validation for VLSI Circuits

by Xiao Liu, Qiang Xu ...

Series series Engineering (R0)
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) ... Read more

$89.99 USD

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD)
... Read more
The Boundary-Scan Handbook

by Kenneth P. Parker ...

Series series Engineering (R0)
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of ... Read more

$134.99 USD

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of
... Read more
Semiconductor Technologies in the Era of Electronics

by Yong Hoon Kang ...

Series series Engineering (R0)
Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore ... Read more

$89.99 USD

Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore
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Regular Nanofabrics in Emerging Technologies

Design and Fabrication Methods for Nanoscale Digital Circuits

by M. Haykel Ben Jamaa ...

Series series Engineering (R0)
Regular Nanofabrics in Emerging Technologies gives a deep insight into both fabrication and design aspects of emerging semiconductor technologies, that represent potential candidates for the post-CMOS era. Its approach is unique, across different fields, and it offers a synergetic view for a public of different communities ranging from technologists, to circuit designers, and computer scientists. ... Read more

$143.99 USD

Regular Nanofabrics in Emerging Technologies gives a deep insight into both fabrication and design aspects of emerging semiconductor technologies, that represent potential candidates for the post-CMOS era. Its approach is unique, across different fields, and it offers a synergetic view for a public of different communities ranging from technologists, to circuit designers, and computer scientists.
... Read more
Research on the Radiation Effects and Compact Model of SiGe HBT

by Yabin Sun ...

Series series Engineering (R0)
This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by ... Read more

$89.99 USD

This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by
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CMOS Test and Evaluation

A Physical Perspective

by Manjul Bhushan, Mark B. Ketchen ...

Series series Engineering (R0)
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers ... Read more

$116.99 USD

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers
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Advanced Materials

Techniques, Physics, Mechanics and Applications

Edited by Ivan A. Parinov, Shun-Hsyung Chang, Muaffaq A. Jani ...

Series series Springer Nature Proceedings excluding Computer Science
This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric ... Read more

$287.99 USD

This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric
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Microwave Electronics

by Andrey D. Grigoriev, Vyacheslav A. Ivanov, Sergey I. Molokovsky ...

Series series Engineering (R0)
This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the ... Read more

$107.99 USD

This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the
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Advanced Materials for Integrated Optical Waveguides

by Xingcun Colin Tong Ph.D ...

Series series Physics and Astronomy (R0)
This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has ... Read more

$143.99 USD

This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has
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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

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VLSI Interview Questions with Answers

Exploring Memory Hierarchy Design with Emerging Memory Technologies

Trace-Based Post-Silicon Validation for VLSI Circuits

The Boundary-Scan Handbook

Semiconductor Technologies in the Era of Electronics

Regular Nanofabrics in Emerging Technologies

Research on the Radiation Effects and Compact Model of SiGe HBT

CMOS Test and Evaluation

Advanced Materials

Microwave Electronics

Advanced Materials for Integrated Optical Waveguides

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